Description
These probes are useful for high peak power laser pulses and can be used in the IR and very deep UV regions where regular fiber probes do not transmit, for example, 10 micron IR wavelengths or vacuum UV wavelengths below 180nm. These probes have a high threshold for damage making them especially useful for nanolithography and for highly localized metal removal using femtosecond laser pulses.
These probes are not recommended for general imaging applications because they can generate higher noise levels due to their immobility, lack of waveguiding and inability to view the probe tip on line.
Intermittent contact mode of operation is not possible with hollow probes because of the need to illuminate the aperture with a lens. Intermittent contact mode results in additional noise under such conditions.
Compatible with
Nanonics NSOM Microscopes